A Survey on Data Collection for Machine Learning: a Big Data -- AI Integration Perspective
November 08, 2018 Β· The Cartographer Β· π IEEE Transactions on Knowledge and Data Engineering
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"Title-pattern auto-detect: A Survey on Data Collection for Machine Learning: a Big Data -- AI Integration Perspective"
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Authors
Yuji Roh, Geon Heo, Steven Euijong Whang
arXiv ID
1811.03402
Category
cs.LG: Machine Learning
Cross-listed
stat.ML
Citations
776
Venue
IEEE Transactions on Knowledge and Data Engineering
Last Checked
1 day ago
Abstract
Data collection is a major bottleneck in machine learning and an active research topic in multiple communities. There are largely two reasons data collection has recently become a critical issue. First, as machine learning is becoming more widely-used, we are seeing new applications that do not necessarily have enough labeled data. Second, unlike traditional machine learning, deep learning techniques automatically generate features, which saves feature engineering costs, but in return may require larger amounts of labeled data. Interestingly, recent research in data collection comes not only from the machine learning, natural language, and computer vision communities, but also from the data management community due to the importance of handling large amounts of data. In this survey, we perform a comprehensive study of data collection from a data management point of view. Data collection largely consists of data acquisition, data labeling, and improvement of existing data or models. We provide a research landscape of these operations, provide guidelines on which technique to use when, and identify interesting research challenges. The integration of machine learning and data management for data collection is part of a larger trend of Big data and Artificial Intelligence (AI) integration and opens many opportunities for new research.
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