ReMP: Rectified Metric Propagation for Few-Shot Learning

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Authors Yang Zhao, Chunyuan Li, Ping Yu, Changyou Chen arXiv ID 2012.00904 Category cs.CV: Computer Vision Cross-listed cs.LG Citations 7 Venue 2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) Last Checked 4 months ago
Abstract
Few-shot learning features the capability of generalizing from a few examples. In this paper, we first identify that a discriminative feature space, namely a rectified metric space, that is learned to maintain the metric consistency from training to testing, is an essential component to the success of metric-based few-shot learning. Numerous analyses indicate that a simple modification of the objective can yield substantial performance gains. The resulting approach, called rectified metric propagation (ReMP), further optimizes an attentive prototype propagation network, and applies a repulsive force to make confident predictions. Extensive experiments demonstrate that the proposed ReMP is effective and efficient, and outperforms the state of the arts on various standard few-shot learning datasets.
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