Model-free Test Time Adaptation for Out-Of-Distribution Detection

November 28, 2023 ยท Declared Dead ยท ๐Ÿ› IEEE Transactions on Pattern Analysis and Machine Intelligence

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Authors YiFan Zhang, Xue Wang, Tian Zhou, Kun Yuan, Zhang Zhang, Liang Wang, Rong Jin, Tieniu Tan arXiv ID 2311.16420 Category cs.LG: Machine Learning Cross-listed cs.CV Citations 5 Venue IEEE Transactions on Pattern Analysis and Machine Intelligence Last Checked 4 months ago
Abstract
Out-of-distribution (OOD) detection is essential for the reliability of ML models. Most existing methods for OOD detection learn a fixed decision criterion from a given in-distribution dataset and apply it universally to decide if a data point is OOD. Recent work~\cite{fang2022is} shows that given only in-distribution data, it is impossible to reliably detect OOD data without extra assumptions. Motivated by the theoretical result and recent exploration of test-time adaptation methods, we propose a Non-Parametric Test Time \textbf{Ada}ptation framework for \textbf{O}ut-Of-\textbf{D}istribution \textbf{D}etection (\abbr). Unlike conventional methods, \abbr utilizes online test samples for model adaptation during testing, enhancing adaptability to changing data distributions. The framework incorporates detected OOD instances into decision-making, reducing false positive rates, particularly when ID and OOD distributions overlap significantly. We demonstrate the effectiveness of \abbr through comprehensive experiments on multiple OOD detection benchmarks, extensive empirical studies show that \abbr significantly improves the performance of OOD detection over state-of-the-art methods. Specifically, \abbr reduces the false positive rate (FPR95) by $23.23\%$ on the CIFAR-10 benchmarks and $38\%$ on the ImageNet-1k benchmarks compared to the advanced methods. Lastly, we theoretically verify the effectiveness of \abbr.
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