Beyond First-Order Tweedie: Solving Inverse Problems using Latent Diffusion

December 01, 2023 ยท Declared Dead ยท ๐Ÿ› Computer Vision and Pattern Recognition

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Authors Litu Rout, Yujia Chen, Abhishek Kumar, Constantine Caramanis, Sanjay Shakkottai, Wen-Sheng Chu arXiv ID 2312.00852 Category cs.LG: Machine Learning Cross-listed cs.CV, stat.ML Citations 71 Venue Computer Vision and Pattern Recognition Last Checked 4 months ago
Abstract
Sampling from the posterior distribution poses a major computational challenge in solving inverse problems using latent diffusion models. Common methods rely on Tweedie's first-order moments, which are known to induce a quality-limiting bias. Existing second-order approximations are impractical due to prohibitive computational costs, making standard reverse diffusion processes intractable for posterior sampling. This paper introduces Second-order Tweedie sampler from Surrogate Loss (STSL), a novel sampler that offers efficiency comparable to first-order Tweedie with a tractable reverse process using second-order approximation. Our theoretical results reveal that the second-order approximation is lower bounded by our surrogate loss that only requires $O(1)$ compute using the trace of the Hessian, and by the lower bound we derive a new drift term to make the reverse process tractable. Our method surpasses SoTA solvers PSLD and P2L, achieving 4X and 8X reduction in neural function evaluations, respectively, while notably enhancing sampling quality on FFHQ, ImageNet, and COCO benchmarks. In addition, we show STSL extends to text-guided image editing and addresses residual distortions present from corrupted images in leading text-guided image editing methods. To our best knowledge, this is the first work to offer an efficient second-order approximation in solving inverse problems using latent diffusion and editing real-world images with corruptions.
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