Potential Field Based Deep Metric Learning

May 28, 2024 Β· Declared Dead Β· πŸ› Computer Vision and Pattern Recognition

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Authors Shubhang Bhatnagar, Narendra Ahuja arXiv ID 2405.18560 Category cs.CV: Computer Vision Cross-listed cs.AI, cs.IR, cs.LG, eess.IV Citations 2 Venue Computer Vision and Pattern Recognition Last Checked 4 months ago
Abstract
Deep metric learning (DML) involves training a network to learn a semantically meaningful representation space. Many current approaches mine n-tuples of examples and model interactions within each tuplets. We present a novel, compositional DML model that instead of in tuples, represents the influence of each example (embedding) by a continuous potential field, and superposes the fields to obtain their combined global potential field. We use attractive/repulsive potential fields to represent interactions among embeddings from images of the same/different classes. Contrary to typical learning methods, where mutual influence of samples is proportional to their distance, we enforce reduction in such influence with distance, leading to a decaying field. We show that such decay helps improve performance on real world datasets with large intra-class variations and label noise. Like other proxy-based methods, we also use proxies to succinctly represent sub-populations of examples. We evaluate our method on three standard DML benchmarks- Cars-196, CUB-200-2011, and SOP datasets where it outperforms state-of-the-art baselines.
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