Automata Models for Effective Bug Pattern Description
July 15, 2025 Β· Declared Dead Β· π ACM/IEEE International Conference on Model Driven Engineering Languages and Systems
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Authors
Tom Yaacov, Gera Weiss, Gal Amram, Avi Hayoun
arXiv ID
2507.11146
Category
cs.SE: Software Engineering
Citations
0
Venue
ACM/IEEE International Conference on Model Driven Engineering Languages and Systems
Last Checked
5 months ago
Abstract
Debugging complex systems is a crucial yet time-consuming task. This paper presents the use of automata learning and testing techniques to obtain concise and informative bug descriptions. We introduce the concepts of Failure Explanations (FE), Eventual Failure Explanations (EFE), and Early Detection (ED) to provide meaningful summaries of failing behavior patterns. By factoring out irrelevant information and focusing on essential test patterns, our approach aims to enhance bug detection and understanding. We evaluate our methods using various test patterns and real-world benchmarks, demonstrating their effectiveness in producing compact and informative bug descriptions.
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