Reduction of Test Re-runs by Prioritizing Potential Order Dependent Flaky Tests
October 30, 2025 Β· Declared Dead Β· π 2025 IEEE/ACM International Flaky Tests Workshop (FTW)
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Authors
Hasnain Iqbal, Zerina Begum, Kazi Sakib
arXiv ID
2510.26171
Category
cs.SE: Software Engineering
Citations
0
Venue
2025 IEEE/ACM International Flaky Tests Workshop (FTW)
Last Checked
5 months ago
Abstract
Flaky tests can make automated software testing unreliable due to their unpredictable behavior. These tests can pass or fail on the same code base on multiple runs. However, flaky tests often do not refer to any fault, even though they can cause the continuous integration (CI) pipeline to fail. A common type of flaky test is the order-dependent (OD) test. The outcome of an OD test depends on the order in which it is run with respect to other test cases. Several studies have explored the detection and repair of OD tests. However, their methods require re-runs of tests multiple times, that are not related to the order dependence. Hence, prioritizing potential OD tests is necessary to reduce the re-runs. In this paper, we propose a method to prioritize potential order-dependent tests. By analyzing shared static fields in test classes, we identify tests that are more likely to be order-dependent. In our experiment on 27 project modules, our method successfully prioritized all OD tests in 23 cases, reducing test executions by an average of 65.92% and unnecessary re-runs by 72.19%. These results demonstrate that our approach significantly improves the efficiency of OD test detection by lowering execution costs.
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